Abstract
A complete uncertainty analysis which includes all sources of systematic and random errors associated with the conversion efficiency-measurement process has not been published to date. The results are reported of an analysis which has shown that a total uncertainty of plus or minus 1. 0% of the efficiency is possible if all sources of systematic and random errors are minimized. A value of plus or minus 7% can be expected even when errors due to linearity, hysterisis, and measurement procedures are neglected. The systematic error limit for the typical case was found to be five times as large as the random error, which demonstrates that the common method of claiming the reproducibility or repeatability in the efficiency to be the total error can be misleading and can grossly underestimate the actual error.
| Original language | American English |
|---|---|
| Pages | 153-159 |
| Number of pages | 7 |
| State | Published - 1987 |
| Event | Nineteenth IEEE Photovoltaic Specialists Conference-1987 - New Orleans, Louisiana Duration: 4 May 1987 → 8 May 1987 |
Conference
| Conference | Nineteenth IEEE Photovoltaic Specialists Conference-1987 |
|---|---|
| City | New Orleans, Louisiana |
| Period | 4/05/87 → 8/05/87 |
NREL Publication Number
- ACNR/CP-213-9055
