Understanding Chemical Inhomogeneities and Cation Gradients in Perovskite Photovoltaics with TOF-SIMS

Steven Harvey

doi:10.1109/PVSC.2018.8548045

Understanding Chemical Inhomogeneities and Cation Gradients in Perovskite Photovoltaics with TOF-SIMS

Steven Harvey

Materials Science

Research output: Contribution to conference › Paper › peer-review

1 Scopus Citations

Abstract

Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organicinorganic perovskite photovoltaics in up to three dimensions. This can yield critical insight into the uniformity of the cations through the thickness of the film (with sub-nm resolution), as well as laterally (with 100nm resolution) We have been using a TOF-SIMS to analyze perovskite photovoltaics at NREL for more than four years and have found many tricks and best practices, summarized here, to get around known artifacts when depth profiling and imaging.

Original language	American English
Pages	2543-2546
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2018.8548045 https://doi.org/10.1109/PVSC.2018.8548045
State	Published - 26 Nov 2018
Event	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States Duration: 10 Jun 2018 → 15 Jun 2018

Conference

Conference	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
Country/Territory	United States
City	Waikoloa Village
Period	10/06/18 → 15/06/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

NREL Publication Number

NREL/CP-5K00-70837

Keywords

gradients
inhomogeneities
perovskite
photovoltaics
TOF-SIMS

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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title = "Understanding Chemical Inhomogeneities and Cation Gradients in Perovskite Photovoltaics with TOF-SIMS",

abstract = "Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organicinorganic perovskite photovoltaics in up to three dimensions. This can yield critical insight into the uniformity of the cations through the thickness of the film (with sub-nm resolution), as well as laterally (with 100nm resolution) We have been using a TOF-SIMS to analyze perovskite photovoltaics at NREL for more than four years and have found many tricks and best practices, summarized here, to get around known artifacts when depth profiling and imaging.",

keywords = "gradients, inhomogeneities, perovskite, photovoltaics, TOF-SIMS",

author = "Steven Harvey",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",

year = "2018",

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doi = "10.1109/PVSC.2018.8548045",

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AB - Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organicinorganic perovskite photovoltaics in up to three dimensions. This can yield critical insight into the uniformity of the cations through the thickness of the film (with sub-nm resolution), as well as laterally (with 100nm resolution) We have been using a TOF-SIMS to analyze perovskite photovoltaics at NREL for more than four years and have found many tricks and best practices, summarized here, to get around known artifacts when depth profiling and imaging.

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KW - inhomogeneities

KW - perovskite

KW - photovoltaics

KW - TOF-SIMS

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M3 - Paper

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EP - 2546

T2 - 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018

Y2 - 10 June 2018 through 15 June 2018

ER -

Understanding Chemical Inhomogeneities and Cation Gradients in Perovskite Photovoltaics with TOF-SIMS

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

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