Abstract
Understanding how photovoltaic (PV) module backsheet polymers age and degrade in response to environmental stresses is important for designing polymers that can maintain their structural integrity after decades of outdoor use. X-ray scattering is a powerful technique for exploring backsheet polymer structure at the angstrom- (wide-angle, WAXS) and nanometer- (small-angle, SAXS) length-scales. We present the use of SAXS and WAXS to study pristine and aged polymer backsheets. The structural insight from these techniques can be used to compare the degradation induced by accelerated testing with the degradation seen in field-aged PV materials.
Original language | American English |
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Pages | 2394-2397 |
Number of pages | 4 |
DOIs | |
State | Published - Jun 2019 |
Event | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019 |
Conference
Conference | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 |
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Country/Territory | United States |
City | Chicago |
Period | 16/06/19 → 21/06/19 |
Bibliographical note
Publisher Copyright:© 2019 IEEE.
NREL Publication Number
- NREL/CP-5K00-76323
Keywords
- accelerated aging
- backsheets
- C-AST
- dampheat
- materials characterization
- polymers
- SAXS
- WAXS
- X-ray scattering