Understanding PV Polymer Backsheet Degradation through X-Ray Scattering

Michael Owen-Bellini, David Miller, Donald Jenket, Peter Hacke, Stephanie Moffitt, Pak Yuen, Ashley Maes, James Hartley, Archana Sinha, Todd Karin, Reinhold Dauskardt, Laura Schelhas

Research output: Contribution to conferencePaperpeer-review

4 Scopus Citations

Abstract

Understanding how photovoltaic (PV) module backsheet polymers age and degrade in response to environmental stresses is important for designing polymers that can maintain their structural integrity after decades of outdoor use. X-ray scattering is a powerful technique for exploring backsheet polymer structure at the angstrom- (wide-angle, WAXS) and nanometer- (small-angle, SAXS) length-scales. We present the use of SAXS and WAXS to study pristine and aged polymer backsheets. The structural insight from these techniques can be used to compare the degradation induced by accelerated testing with the degradation seen in field-aged PV materials.

Original languageAmerican English
Pages2394-2397
Number of pages4
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period16/06/1921/06/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

NREL Publication Number

  • NREL/CP-5K00-76323

Keywords

  • accelerated aging
  • backsheets
  • C-AST
  • dampheat
  • materials characterization
  • polymers
  • SAXS
  • WAXS
  • X-ray scattering

Fingerprint

Dive into the research topics of 'Understanding PV Polymer Backsheet Degradation through X-Ray Scattering'. Together they form a unique fingerprint.

Cite this