Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

Research output: Contribution to conference › Paper

Abstract

Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more completeGibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.

Original language	American English
Number of pages	7
State	Published - 2005
Event	31st IEEE Photovoltaics Specialists Conference and Exhibition - Lake Buena Vista, Florida Duration: 3 Jan 2005 → 7 Jan 2005

Conference

Conference	31st IEEE Photovoltaics Specialists Conference and Exhibition
City	Lake Buena Vista, Florida
Period	3/01/05 → 7/01/05

NREL Publication Number

NREL/CP-520-37359

Keywords

activation energy
bias-pulse experiments
capacitance transients
carrier emission
CdS
CIGS
enthalpy
Gibbs free-energy
minority-carrier traps
PV

Access to Document

https://www.nrel.gov/docs/fy05osti/37359.pdf

Cite this

@conference{ef98405d2ae24cc0a53ab2066afd2b23,

title = "Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes",

abstract = "Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more completeGibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.",

keywords = "activation energy, bias-pulse experiments, capacitance transients, carrier emission, CdS, CIGS, enthalpy, Gibbs free-energy, minority-carrier traps, PV",

author = "NREL",

year = "2005",

language = "American English",

note = "31st IEEE Photovoltaics Specialists Conference and Exhibition ; Conference date: 03-01-2005 Through 07-01-2005",

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TY - CONF

T1 - Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

AU - NREL, null

PY - 2005

Y1 - 2005

N2 - Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more completeGibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.

AB - Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more completeGibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.

KW - activation energy

KW - bias-pulse experiments

KW - capacitance transients

KW - carrier emission

KW - CdS

KW - CIGS

KW - enthalpy

KW - Gibbs free-energy

KW - minority-carrier traps

KW - PV

M3 - Paper

T2 - 31st IEEE Photovoltaics Specialists Conference and Exhibition

Y2 - 3 January 2005 through 7 January 2005

ER -

Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

Abstract

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this