Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

David L. Young, Kannan Ramanathan, Richard S. Crandall

Research output: Contribution to conferencePaperpeer-review

2 Scopus Citations

Fingerprint

Dive into the research topics of 'Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes'. Together they form a unique fingerprint.

Material Science

Chemistry