Use of Optical Scattering to Characterize Dislocations in Semiconductors

Research output: Contribution to journal › Article

NREL Publication Number

@article{3629e412686141e9b79159f7638df69a,

title = "Use of Optical Scattering to Characterize Dislocations in Semiconductors",

author = "NREL",

year = "1988",

doi = "10.1364/AO.27.004676",

language = "American English",

volume = "27",

pages = "4676--4683",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optica Publishing Group",

number = "22",

}