Using Accelerated Testing to Predict Module Reliability

Sarah Kurtz

doi:10.1109/pvsc.2011.6185927

Using Accelerated Testing to Predict Module Reliability

Research output: Contribution to conference › Paper

Original language	American English
Pages	003601-003605
Number of pages	5
DOIs	https://doi.org/10.1109/pvsc.2011.6185927
State	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference (PVSC '11) - Seattle, Washington Duration: 19 Jun 2011 → 24 Jun 2011

Conference

Conference	37th IEEE Photovoltaic Specialists Conference (PVSC '11)
City	Seattle, Washington
Period	19/06/11 → 24/06/11

Bibliographical note

See NREL/CP-5200-50645 for preprint

NREL Publication Number

NREL/CP-5200-55767

Access to Document

10.1109/pvsc.2011.6185927

Cite this

@conference{a5e10d9b116d4e8d80845e25f29c1d5c,

title = "Using Accelerated Testing to Predict Module Reliability",

author = "Sarah Kurtz",

note = "See NREL/CP-5200-50645 for preprint; 37th IEEE Photovoltaic Specialists Conference (PVSC '11) ; Conference date: 19-06-2011 Through 24-06-2011",

year = "2011",

doi = "10.1109/pvsc.2011.6185927",

language = "American English",

pages = "003601--003605",

}

TY - CONF

T1 - Using Accelerated Testing to Predict Module Reliability

AU - Kurtz, Sarah

N1 - See NREL/CP-5200-50645 for preprint

PY - 2011

Y1 - 2011

UR - http://www.scopus.com/inward/record.url?scp=84861022582&partnerID=8YFLogxK

U2 - 10.1109/pvsc.2011.6185927

DO - 10.1109/pvsc.2011.6185927

M3 - Paper

SP - 3601

EP - 3605

T2 - 37th IEEE Photovoltaic Specialists Conference (PVSC '11)

Y2 - 19 June 2011 through 24 June 2011

ER -

Using Accelerated Testing to Predict Module Reliability

Conference

Bibliographical note

NREL Publication Number

Access to Document

Other files and links

Fingerprint

Cite this