Using Accelerated Testing To Predict Module Reliability: Preprint

    Research output: Contribution to conferencePaper


    Long-term reliability is critical to the cost effectiveness and commercial success of photovoltaic (PV) products. Today most PV modules are warranted for 25 years, but there is no accepted test protocol to validate a 25-year lifetime. The qualification tests do an excellent job of identifying design, materials, and process flaws that are likely to lead to premature failure (infant mortality), butthey are not designed to test for wear-out mechanisms that limit lifetime. This paper presents a method for evaluating the ability of a new PV module technology to survive long-term exposure to specific stresses. The authors propose the use of baseline technologies with proven long-term field performance as controls in the accelerated stress tests. The performance of new-technology modules canthen be evaluated versus that of proven-technology modules. If the new-technology demonstrates equivalent or superior performance to the proven one, there is a high likelihood that they will survive versus the tested stress in the real world.
    Original languageAmerican English
    Number of pages7
    StatePublished - 2011
    Event37th IEEE Photovoltaic Specialists Conference (PVSC 37) - Seattle, Washington
    Duration: 19 Jun 201124 Jun 2011


    Conference37th IEEE Photovoltaic Specialists Conference (PVSC 37)
    CitySeattle, Washington

    NREL Publication Number

    • NREL/CP-5200-50646


    • accelerated testing
    • module reliability
    • PV
    • reliability


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