Using Resonant Energy X-Ray Diffraction to Extract Chemical Order Parameters in Ternary Semiconductors

Rekha R. Schnepf, Ben L. Levy-Wendt, M. Brooks Tellekamp, Brenden R. Ortiz, Celeste L. Melamed, Laura T. Schelhas, Kevin H. Stone, Michael F. Toney, Eric S. Toberer, Adele C. Tamboli

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