UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Dana Sulas-Kern; Steve Johnston; Michael Owen-Bellini; Kent Terwilliger; Jenya Meydbray; Laura Spinella; Archana Sinha; Laura Schelhas; Dirk Jordan

doi:10.1109/PVSC45281.2020.9300901

UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Dana Sulas-Kern, Steve Johnston, Michael Owen-Bellini, Kent Terwilliger, Jenya Meydbray, Laura Spinella, Archana Sinha, Laura Schelhas, Dirk Jordan

Materials Science

Research output: Contribution to conference › Paper › peer-review

10 Scopus Citations

Abstract

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for solar cell crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF and the rates of UVF formation and quenching. Ultimately, further understanding could enable estimating the age and propagation rates of cracks.

Original language	American English
Pages	1444-1448
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC45281.2020.9300901 https://doi.org/10.1109/PVSC45281.2020.9300901
State	Published - 14 Jun 2020
Event	47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: 15 Jun 2020 → 21 Aug 2020

Conference

Conference	47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/Territory	Canada
City	Calgary
Period	15/06/20 → 21/08/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

NREL Publication Number

NREL/CP-5K00-75952

Keywords

Fluorescence
imaging
reliability
solar panels

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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Sulas-Kern, D., Johnston, S., Owen-Bellini, M., Terwilliger, K., Meydbray, J., Spinella, L., Sinha, A., Schelhas, L., & Jordan, D. (2020). UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing. 1444-1448. Paper presented at 47th IEEE Photovoltaic Specialists Conference, PVSC 2020, Calgary, Canada. https://doi.org/10.1109/PVSC45281.2020.9300901, https://doi.org/10.1109/PVSC45281.2020.9300901

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abstract = "Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for solar cell crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF and the rates of UVF formation and quenching. Ultimately, further understanding could enable estimating the age and propagation rates of cracks.",

keywords = "Fluorescence, imaging, reliability, solar panels",

author = "Dana Sulas-Kern and Steve Johnston and Michael Owen-Bellini and Kent Terwilliger and Jenya Meydbray and Laura Spinella and Archana Sinha and Laura Schelhas and Dirk Jordan",

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Sulas-Kern, D , Johnston, S , Owen-Bellini, M , Terwilliger, K, Meydbray, J, Spinella, L, Sinha, A, Schelhas, L & Jordan, D 2020, 'UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing', Paper presented at 47th IEEE Photovoltaic Specialists Conference, PVSC 2020, Calgary, Canada, 15/06/20 - 21/08/20 pp. 1444-1448. https://doi.org/10.1109/PVSC45281.2020.9300901, https://doi.org/10.1109/PVSC45281.2020.9300901

TY - CONF

T1 - UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

AU - Sulas-Kern, Dana

AU - Johnston, Steve

AU - Owen-Bellini, Michael

AU - Terwilliger, Kent

AU - Meydbray, Jenya

AU - Spinella, Laura

AU - Sinha, Archana

AU - Schelhas, Laura

AU - Jordan, Dirk

PY - 2020/6/14

Y1 - 2020/6/14

N2 - Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for solar cell crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF and the rates of UVF formation and quenching. Ultimately, further understanding could enable estimating the age and propagation rates of cracks.

AB - Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for solar cell crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF and the rates of UVF formation and quenching. Ultimately, further understanding could enable estimating the age and propagation rates of cracks.

KW - Fluorescence

KW - imaging

KW - reliability

KW - solar panels

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DO - 10.1109/PVSC45281.2020.9300901

M3 - Paper

AN - SCOPUS:85099558083

SP - 1444

EP - 1448

T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020

Y2 - 15 June 2020 through 21 August 2020

ER -

UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

Access to Document

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