UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Dana Sulas-Kern, Steve Johnston, Michael Owen-Bellini, Kent Terwilliger, Jenya Meydbray, Laura Spinella, Archana Sinha, Laura Schelhas, Dirk Jordan

Research output: Contribution to conferencePaperpeer-review

8 Scopus Citations

Abstract

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for solar cell crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF and the rates of UVF formation and quenching. Ultimately, further understanding could enable estimating the age and propagation rates of cracks.

Original languageAmerican English
Pages1444-1448
Number of pages5
DOIs
StatePublished - 14 Jun 2020
Event47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada
Duration: 15 Jun 202021 Aug 2020

Conference

Conference47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/TerritoryCanada
CityCalgary
Period15/06/2021/08/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

NREL Publication Number

  • NREL/CP-5K00-75952

Keywords

  • Fluorescence
  • imaging
  • reliability
  • solar panels

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