Vacuum-Based Time-Resolved Photoluminescence Measurement System Provides New Capability (Fact Sheet)

Research output: NRELFact Sheet

Abstract

New measurement capability measures semiconductor minority-carrier lifetimes in conditions that simulate thin-film photovoltaic manufacturing environments.
Original languageAmerican English
StatePublished - 2011

NREL Publication Number

  • NREL/FS-5200-53061

Keywords

  • minority-carrier lifetimes
  • NREL Highlights
  • PV
  • solar
  • thin film
  • time-resolved photoluminescence (TRPL)

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