Abstract
New measurement capability measures semiconductor minority-carrier lifetimes in conditions that simulate thin-film photovoltaic manufacturing environments.
| Original language | American English |
|---|---|
| State | Published - 2011 |
NLR Publication Number
- NREL/FS-5200-53061
Keywords
- minority-carrier lifetimes
- NREL Highlights
- PV
- solar
- thin film
- time-resolved photoluminescence (TRPL)