Abstract
The PVSCAN is an instrument designed to characterize silicon solar cell materials and devices. It performs a host of measurements that yield spatial maps of dislocation density, grain distribution, reflectance, and photoresponses from near-junction and the bulk of a solar cell.
| Original language | American English |
|---|---|
| Pages | 295-299 |
| Number of pages | 5 |
| State | Published - 2002 |
| Event | 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes - Breckenridge, Colorado Duration: 11 Aug 2002 → 14 Aug 2002 |
Conference
| Conference | 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes |
|---|---|
| City | Breckenridge, Colorado |
| Period | 11/08/02 → 14/08/02 |
NREL Publication Number
- NREL/CP-520-32714
Keywords
- 12th workshop
- crystalline silicon (x-Si) (c-Si)
- PV
- solar cell materials