Wafer and Solar Cell Characterization by GT-PVSCAN6000

Research output: Contribution to conferencePaper

Abstract

The PVSCAN is an instrument designed to characterize silicon solar cell materials and devices. It performs a host of measurements that yield spatial maps of dislocation density, grain distribution, reflectance, and photoresponses from near-junction and the bulk of a solar cell.
Original languageAmerican English
Pages295-299
Number of pages5
StatePublished - 2002
Event12th Workshop on Crystalline Silicon Solar Cell Materials and Processes - Breckenridge, Colorado
Duration: 11 Aug 200214 Aug 2002

Conference

Conference12th Workshop on Crystalline Silicon Solar Cell Materials and Processes
CityBreckenridge, Colorado
Period11/08/0214/08/02

NREL Publication Number

  • NREL/CP-520-32714

Keywords

  • 12th workshop
  • crystalline silicon (x-Si) (c-Si)
  • PV
  • solar cell materials

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