Wild Band Edges: The Role of Bandgap Grading and Band-Edge Fluctuations in High-Efficiency Chalcogenide Devices: Preprint

Ingrid Repins, Lorelle Mansfield, Darius Kuciauskas, Stephen Glynn, Teresa Barnes, Wyatt Metzger, Chun Sheng Jiang, Patricia Dippo, Glenn Teeter, Andriy Zakutayev, Stephan Lany, Brian Egaas, Pawel Zawadzki, Suhuai Wei, Craig Perkins, Steven Harvey, Jan-Hendrik Alsmeier, Thomas Lussky, Lars Korte, Regan WilksMarcus Bar, Ana Kanevce, James Burst, Ji-Sang Park

Research output: Contribution to conferencePaper

Abstract

Band-edge effects -- including grading, electrostatic fluctuations, bandgap fluctuations, and band tails -- affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In,Ga)Se2 devices, recent increases in diffusion length imply changes to optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties and defect formation energies, is examined.
Original languageAmerican English
Number of pages9
StatePublished - 2016
Event43rd IEEE Photovoltaic Specialists Conference - Portland, Oregon
Duration: 5 Jun 201610 Jun 2016

Conference

Conference43rd IEEE Photovoltaic Specialists Conference
CityPortland, Oregon
Period5/06/1610/06/16

NREL Publication Number

  • NREL/CP-5J00-65682

Keywords

  • band gap
  • CdTe
  • chalcogen
  • CIGS
  • kesterite
  • potential fluctuation

Fingerprint

Dive into the research topics of 'Wild Band Edges: The Role of Bandgap Grading and Band-Edge Fluctuations in High-Efficiency Chalcogenide Devices: Preprint'. Together they form a unique fingerprint.

Cite this