Abstract
Band-edge effects -- including grading, electrostatic fluctuations, bandgap fluctuations, and band tails -- affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In,Ga)Se2 devices, recent increases in diffusion length imply changes to optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties and defect formation energies, is examined.
Original language | American English |
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Number of pages | 9 |
State | Published - 2016 |
Event | 43rd IEEE Photovoltaic Specialists Conference - Portland, Oregon Duration: 5 Jun 2016 → 10 Jun 2016 |
Conference
Conference | 43rd IEEE Photovoltaic Specialists Conference |
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City | Portland, Oregon |
Period | 5/06/16 → 10/06/16 |
NREL Publication Number
- NREL/CP-5J00-65682
Keywords
- band gap
- CdTe
- chalcogen
- CIGS
- kesterite
- potential fluctuation