Wild Band Edges: The Role of Bandgap Grading and Band-Edge Fluctuations in High-Efficiency Chalcogenide Devices

Ingrid Repins, Lorelle Mansfield, Ana Kanevce, Soren A. Jensen, Darius Kuciauskas, Stephen Glynn, Teresa Barnes, Wyatt Metzger, James Burst, Chun Sheng Jiang, Patricia Dippo, Steve Harvey, Glenn Teeter, C. Perkins, Brian Egaas, Andriy Zakutayev, Jan Hendrik Alsmeier, Thomas Lusky, Lars Korte, Regan G. WilksMarcus Bar, Yanfa Yan, Stephan Lany, Pawel Zawadzki, Ji Sang Park, Suhuai Wei

Research output: Contribution to conferencePaperpeer-review

17 Scopus Citations

Abstract

Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties, is examined.

Original languageAmerican English
Pages309-314
Number of pages6
DOIs
StatePublished - 18 Nov 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/TerritoryUnited States
CityPortland
Period5/06/1610/06/16

Bibliographical note

See NREL/CP-5J00-65682 for preprint

NREL Publication Number

  • NREL/CP-5J00-67966

Keywords

  • CAS
  • CdTe
  • CIGS
  • CTS
  • CZTS
  • defect
  • fluctuations
  • grading

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