Abstract
The lateral composition modulation in (InAs)n/(AIAs)m short-period superlattices was studied by means of synchrotron x-ray diffraction. By choosing specific diffraction vectors having a large component closely parallel to the modulation direction, we are able to observe a number of lateral satellite peaks around the zero-order short-period superlattice peak. A model, incorporating both composition and strain, is used to simulate the intensities of these satellites. Our results provide a quantitative fit and permit the evaluation of the composition amplitude.
Original language | American English |
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Pages (from-to) | 219-221 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 78 |
Issue number | 2 |
DOIs | |
State | Published - 2001 |
NREL Publication Number
- NREL/JA-590-29902