X-Ray Analysis of Spontaneous Lateral Modulation in (InAs)n/(AlAs)m Short-Period Superlattices

J. H. Li, V. Holý, Z. Zhong, J. Kulik, S. C. Moss, A. G. Norman, A. Mascarenhas, J. L. Reno, D. M. Follstaedt

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The lateral composition modulation in (InAs)n/(AIAs)m short-period superlattices was studied by means of synchrotron x-ray diffraction. By choosing specific diffraction vectors having a large component closely parallel to the modulation direction, we are able to observe a number of lateral satellite peaks around the zero-order short-period superlattice peak. A model, incorporating both composition and strain, is used to simulate the intensities of these satellites. Our results provide a quantitative fit and permit the evaluation of the composition amplitude.

Original languageAmerican English
Pages (from-to)219-221
Number of pages3
JournalApplied Physics Letters
Issue number2
StatePublished - 2001

NREL Publication Number

  • NREL/JA-590-29902


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