X-ray Diffraction and Excitation Photoluminescence Analysis of Ordered GaInP

R. Forrest, T. Golding, S. Moss, Y. Zhang, J. Geisz, J. Olson, A. Mascarenhas

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X-ray diffraction is shown to provide a direct, quantitative, structural measurement of the degree of spontaneous ordering in GaInP. In this paper we combine x-ray diffraction and excitation photoluminescence analyses of CuPt-ordered GaInP, and comparing the results to theoretical predictions for the dependence of the band structure on order parameter, determine the values of the band-gap reduction and crystal-field splitting parameters for the perfectly ordered alloy.

Original languageAmerican English
Pages (from-to)15355-15358
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number23
StatePublished - 1998

NREL Publication Number

  • NREL/JA-590-26055


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