Abstract
X-ray diffraction is shown to provide a direct, quantitative, structural measurement of the degree of spontaneous ordering in GaInP. In this paper we combine x-ray diffraction and excitation photoluminescence analyses of CuPt-ordered GaInP, and comparing the results to theoretical predictions for the dependence of the band structure on order parameter, determine the values of the band-gap reduction and crystal-field splitting parameters for the perfectly ordered alloy.
Original language | American English |
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Pages (from-to) | 15355-15358 |
Number of pages | 4 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 58 |
Issue number | 23 |
DOIs | |
State | Published - 1998 |
NREL Publication Number
- NREL/JA-590-26055