X-Ray Fluorescence as an In-Situ Composition Monitor During CuInxGa1-xSe2 Deposition

Research output: Contribution to conferencePaper

Original languageAmerican English
Number of pages6
StatePublished - 1999
EventNCPV Photovoltaics Program Review: 15th Conference - Denver, Colorado
Duration: 9 Sep 199811 Sep 1998


ConferenceNCPV Photovoltaics Program Review: 15th Conference
CityDenver, Colorado

Bibliographical note

Work performed by Materials Research Group, Inc, Wheat Ridge, Colorado and Lockheed Martin Astronautics, Denver, Colorado

NREL Publication Number

  • NREL/CP-520-27379

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