X-Ray Fluorescence as an In-Situ Composition Monitor During CuInxGa1-xSe2 Deposition

X-Ray Fluorescence as an In-Situ Composition Monitor During CuInxGa1-xSe2 Deposition

Research output: Contribution to conference › Paper

Original language	American English
Pages	138-143
Number of pages	6
State	Published - 1999
Event	NCPV Photovoltaics Program Review: 15th Conference - Denver, Colorado Duration: 9 Sep 1998 → 11 Sep 1998

Conference

Conference	NCPV Photovoltaics Program Review: 15th Conference
City	Denver, Colorado
Period	9/09/98 → 11/09/98

Bibliographical note

Work performed by Materials Research Group, Inc, Wheat Ridge, Colorado and Lockheed Martin Astronautics, Denver, Colorado

NREL Publication Number

NREL/CP-520-27379

Cite this

@conference{05d7e57b27514b82b8a72c28bc4d1a2b,

title = "X-Ray Fluorescence as an In-Situ Composition Monitor During CuInxGa1-xSe2 Deposition",

author = "NREL",

note = "Work performed by Materials Research Group, Inc, Wheat Ridge, Colorado and Lockheed Martin Astronautics, Denver, Colorado; NCPV Photovoltaics Program Review: 15th Conference ; Conference date: 09-09-1998 Through 11-09-1998",

year = "1999",

language = "American English",

pages = "138--143",

}

TY - CONF

T1 - X-Ray Fluorescence as an In-Situ Composition Monitor During CuInxGa1-xSe2 Deposition

AU - NREL, null

N1 - Work performed by Materials Research Group, Inc, Wheat Ridge, Colorado and Lockheed Martin Astronautics, Denver, Colorado

PY - 1999

Y1 - 1999

M3 - Paper

SP - 138

EP - 143

T2 - NCPV Photovoltaics Program Review: 15th Conference

Y2 - 9 September 1998 through 11 September 1998

ER -