X-ray Photoelectron Spectroscopy Investigation of Ion Beam Sputtered Indium Tin Oxide Films as a Function of Oxygen Pressure during Deposition

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)231-233
    Number of pages3
    JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
    Issue number2
    StatePublished - 1987

    Bibliographical note

    Work performed by Solar Energy Research Institute, Golden, Colorado, and Department of Electrical and Computer Engineering, Ben-Gurion University of the Negev, Beer-Sheva, Israel

    NREL Publication Number

    • ACNR/JA-213-9042

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