Abstract
X-ray photoelectron spectroscopy (XPS) is used to identify the interactions at a metal/organic interface formed by evaporation of Cr overlayers on the methyl ester groups at the surface of a self-assembled monolayer (SAM) of 16-mercaptohexadecanoate [HS(CH2)COOCH3] on gold. The high reactivity of Cr with COOCH3 groups promotes the growth of a relatively smooth Cr layer on top of the SAM. TheCr-COOCH3 interaction forms a dominant species for Cr/end group ratios less than 1, which is similar to that formed in the Cr-COOCH interaction on a SAM, but an additional species corresponding to an O 1s component at a higher binding energy is also formed that is not understood. For higher coverages, a Cr(III) oxide is formed by dissociation of oxygen primarily from the SAM end groups.Adsorption of oxygen-containing species from the UHV ambient was found to have little effect on the results for less than 0.6 nm Cr coverage.
| Original language | American English |
|---|---|
| Pages | 513-516 |
| Number of pages | 4 |
| State | Published - 1996 |
| Event | ECASIA 95: 6th European Conference on Applications of Surface and Interface Analysis - Montreux, Switzerland Duration: 9 Oct 1995 → 13 Oct 1995 |
Conference
| Conference | ECASIA 95: 6th European Conference on Applications of Surface and Interface Analysis |
|---|---|
| City | Montreux, Switzerland |
| Period | 9/10/95 → 13/10/95 |
NREL Publication Number
- NREL/CP-412-8123