Abstract
The chemical state of nitrogen, aluminum, oxygen and zinc in Al-N co-doped p-type ZnO thin films was investigated by X-ray photoelectron spectroscopy (XPS). N1s peak were detected in both the two p-type ZnO thin films, showing two components. The higher binding energy peak may be due to the Al-NO-H species, and the lower one perhaps derive from the (NH2)- cluster for the ammonia introduction. These two peaks both contribute to the p-type behavior in the ZnO films. A symmetry 74.4 eV binding energy in Al2p3/2 photoelectron peaks revealed an Al-N bonding state, a key factor to the co-doping method.
Original language | American English |
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Pages (from-to) | 2341-2344 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 311 |
Issue number | 8 |
DOIs | |
State | Published - 2009 |
NREL Publication Number
- NREL/JA-520-46136
Keywords
- A1. Electrical properties
- A1. X-ray photoelectron spectroscopy
- A1. ZnO
- Al- and N- co-doping