XPS and AES Studies of Cu/CdTe(111)-B

Research output: Contribution to conferencePaper


Copper is frequently used as a p-type dopant to improve the performance of back contacts in CdTe thin-film solar cells. In this study, surface-analysis techniques are used to probe fundamental interactions between Cu and the CdTe(111)-B surface. The results presented here were facilitated by the newly constructed surface-analysis cluster tool in the Measurements and Characterization Division atNREL; they reveal a host of fundamental phenomena that occur in the Cu/CdTe system.
Original languageAmerican English
Number of pages5
StatePublished - 2005
Event2004 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado
Duration: 25 Oct 200428 Oct 2004


Conference2004 DOE Solar Energy Technologies Program Review Meeting
CityDenver, Colorado

Bibliographical note

Presented at the 2004 DOE Solar Energy Technologies Program Review Meeting, 25-28 October 2004, Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102005-2067; NREL/CD-520-37140)

NREL Publication Number

  • NREL/CP-520-37038


  • auger electron spectroscopy (AES)
  • back contacts
  • p-Type dopant
  • PV
  • scanning auger microscopy (SAM)
  • solar cells
  • temperature-programmed desorption (TPD)
  • thin films
  • x-ray photoelectron spectroscopy (XPS)


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