XPS and UPS investigation of PF₆ doped and undoped poly 3-methyl thiophene

XPS and UPS techniques have been used to characterize electrochemically grown conductive films using two different solvent systems of poly (3-methyl thiophene) in the PF₆ doped and undoped states. Core-level and valence-level spectra have yielded information on the nature of the polymeric cation and its associated PF₆ anion as well as structural disorder effects in these polymers. Results have revealed that addition of the PF ₆ anion causes structural disorder within the polymer and that the PF₆ anion interacts with the highest occupied nonbonding lone pair orbital. Solvent system effects are also evident.